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Characterization Webinar - Shared screen with speaker view
Stephanie Malone
48:58
Can anyone else see the screen?
Furkan Turker
49:07
y
Catarina Miranda
49:09
I can
Lei Wang
49:12
yes
Xianhu Sun
49:12
Y
drose
49:13
yes
PJakubcova
49:13
yes
kmcdonald
49:13
yes
Shubhmita
49:14
Y
Shiv Prakash Singh
49:17
yes, I can
xiaochen
49:18
y
Scott
49:21
yes
Vishnu
49:24
I can
John8300
49:24
Yes
Marta Teixeira
49:27
y
10051740
49:28
yes
Haridas
49:33
yes
Kiran Varma
49:37
yes
sindhusivannair
49:39
yes
Thomas Larrabee
49:40
yes
Claudia.Fafard
49:56
yes
Piramiah Elayaperumal
49:59
y
Abitha
50:14
Yes
Stephanie Malone
50:17
Thanks, I exited and came back, its working now
Susheng
50:28
yes
Kalaiarasan M
57:25
Dr.Jerry, Please do take Care of you
Kalaiarasan M
01:28:42
As destructive is unavoidable, where SIMS stands in semiconductor's process line?
Timmy O'Shea
01:35:49
How deep is the depth profiling accurate to?
sintu rongpipi
01:35:50
is there any specific sample preparation for static sims?
Fabrizio.MARCHEGIANI
01:35:55
will the slide be shared?
Linxi Xu
01:36:06
My internet has been terribly unstable. Do you mind share the recording to me?
ssankara
01:36:28
How good is SIMS in detecting elements in the middle of the periodic table?
Gibson Scisco
01:36:35
In terms of depth profiling, what is a typical maximum depth and what is the depth resolution per step?
NeilGcamp
01:36:51
Can you blend Cs and O ions to get sensitivity to both cations and anions in polar materials?
Dongho Lee
01:36:53
Does the etching rate depend on the atomic weight of the element?
Phong.NGUYEN
01:36:53
How does SIMs solve preferential sputtering?
Kevin
01:36:55
how will the sample surface roughness affect the resolution? i.e. cellulose coating on the drug, has that been corrected for the round shape? would that affect the signal?
Kiran Varma
01:37:02
Hydrocarbon based coated nanomaterials can analysed through TOF SIMS ?
haggertyj
01:37:19
Email?
lydiajk
01:37:31
If the ion range you're trying to detect is within 1-2 microns do you suggest using static over DIMS for a depth profile?
Frank Palmieri
01:37:32
Interested in ToF-SIMS on polymer substrates. Is that to be included?
Shiv Prakash Singh
01:37:33
If in my sample has 5 elements, then should I need 5 standard elements?
4776419313
01:37:42
Please your email
JDJones
01:39:53
Can D-SIMS and S-SIMS be carried out in one instrument or are two required?
sardelamauro
01:40:14
Thanks, Jerry, great talk!
julianbigi
01:40:23
Thanks Jerry!
Lei Wang
01:40:24
thank you, great talk
Shiv Prakash Singh
01:40:24
Thanks a lot!
yang wu
01:40:25
Thanks, Jerry
BB
01:40:26
Thank you!
Sikai
01:40:30
Thanks!
Linxi Xu
01:40:30
Thank you
Alex
01:40:32
thanks!
Mengjing Wang
01:40:33
Thank you!
Steve Manfred
01:40:33
Thanks
OErol
01:40:35
thank you
krystalyork
01:40:35
Thank you
Elaine Zhou
01:40:35
thanks
TIANYI ZHANG
01:40:36
Thanks!